Modified Shewhart Charts for High Yield Processes

DOI10.1080/02664760701546279OpenAlexW2010247739MaRDI QIDQ5123309

Tee-Chin Chang, Fah-Fatt Gan

Publication date: 28 September 2020

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664760701546279

zbMATH Keywords

statistical process controlaverage run lengthbinomial countsparts-per-million non-conforming itemssupplementary runs rules

Mathematics Subject Classification ID

Statistics (62-XX)

Related Items (1)

Monitoring a bi-attribute high-quality process using a mixture probability distribution

Cites Work

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• Performance of cumulative sum schemes for monitoring low count-level processes
• CONTROL CHARTS WITH WARNING LINES
• A discrete markov chain representation of The sequential probability ratio test
• Exact Results for Shewhart Control Charts with Supplementary Runs Rules
• An approach to the probability distribution of cusum run length
• Sample size and the binomial CUSUM control chart: The case of 100\% inspection

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