Cumulative sum charts for high yield processes
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Publication:2746501
zbMATH Open0999.62095MaRDI QIDQ2746501FDOQ2746501
Authors: T. C. Chang, F. F. Gan 
Publication date: 13 March 2002
Published in: Statistica Sinica (Search for Journal in Brave)
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Applications of statistics in engineering and industry; control charts (62P30) Statistical tables (62Q05)
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- Optimal cumulative sum charting procedures based on kernel densities
- Modified Shewhart charts for high yield processes
- EWMA control charts for monitoring correlated counts with finite range
- Sequential monitoring of a Bernoulli sequence when the pre-change parameter is unknown
- On statistical design of the cumulative quantity control chart for monitoring high yield processes
- ARL-unbiased geometric and \(CCC_G\) control charts
- Cumulate sum quality control method selection
- A progressive mean control chart for COM-Poisson distribution
- Counted Data CUSUM's
- EWMA control charts for monitoring high yield processes
- Monitoring of zero-inflated binomial processes with a DEWMA control chart
- Performance of cumulative sum schemes for monitoring low count-level processes
- Monitoring high-yields processes with defects count in nonconforming items by artificial neural network
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