Cumulative sum charts for high yield processes
From MaRDI portal
Publication:2746501
Recommendations
Cited in
(15)- EWMA control charts for monitoring high-yield processes based on non-transformed observations
- scientific article; zbMATH DE number 1146587 (Why is no real title available?)
- Optimal cumulative sum charting procedures based on kernel densities
- Modified Shewhart charts for high yield processes
- EWMA control charts for monitoring correlated counts with finite range
- Sequential monitoring of a Bernoulli sequence when the pre-change parameter is unknown
- On statistical design of the cumulative quantity control chart for monitoring high yield processes
- ARL-unbiased geometric and \(CCC_G\) control charts
- Cumulate sum quality control method selection
- A progressive mean control chart for COM-Poisson distribution
- Counted Data CUSUM's
- EWMA control charts for monitoring high yield processes
- Monitoring of zero-inflated binomial processes with a DEWMA control chart
- Performance of cumulative sum schemes for monitoring low count-level processes
- Monitoring high-yields processes with defects count in nonconforming items by artificial neural network
This page was built for publication: Cumulative sum charts for high yield processes
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2746501)
