On persistent homology of random \v{C}ech complexes

MaRDI QIDQ5146758zbMATH OpenFDO

Authors Khanh Duy Trinh

Publication date 1 February 2021

Full work available at URL https://arxiv.org/abs/1902.08063, https://repository.kulib.kyoto-u.ac.jp/dspace/bitstream/2433/260653/1/B79-13.pdf

zbMATH Keywords

binomial point processcritical simplexgeneralized discrete Morse theorypersistence diagramČech complex

Mathematics Subject Classification ID

Persistent homology and applications, topological data analysis (55N31) Discrete Morse theory and related ideas in manifold topology (57Q70) Geometric probability and stochastic geometry (60D05) Interacting random processes; statistical mechanics type models; percolation theory (60K35)

Abstract: The paper studies the relation between critical simplices and persistence diagrams of the v{C}ech filtration. We show that adding a critical $k$-simplex into the filtration corresponds either to a point in the $k$th persistence diagram or a point in the $(k-1)$st persistence diagram. Consequently, the number of points in persistence diagrams can be expressed in terms of the number of critical simplices. As an application, we establish some convergence results related to persistence diagrams of the v{C}ech filtrations built over binomial point processes.

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Cited in

(12)

• Maximally persistent cycles in random geometric complexes
• Convergence of persistence diagram in the sparse regime
• Homotopy types of random cubical complexes
• Extremal lifetimes of persistent cycles
• Randomly weighted \(d\)-complexes: minimal spanning acycles and persistence diagrams
• Distance functions, critical points, and the topology of random Čech complexes
• scientific article; zbMATH DE number 7206834 (Why is no real title available?)
• Stochastic homology of Gaussian vs. non-Gaussian random fields: graphs towards Betti numbers and persistence diagrams
• On the persistent homology of almost surely C^0 stochastic processes
• A limit theorem for persistence diagrams of random filtered complexes built over marked point processes
• Maximal persistence in random clique complexes
• Large deviation principle for persistence diagrams of random cubical filtrations

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