A statistical method for obtaining the factors in electronic-component reliability-prediction models

DOI10.1109/24.249583MaRDI QIDQ5288671zbMATH OpenOpenAlexFDO

Authors Zhongsen Yang, Hazem Raafat

Publication date 16 August 1993

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/24.249583

Mathematics Subject Classification ID

Reliability and life testing (62N05)

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