Goodness-of-fit test based on correcting moments of modified entropy estimator
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Publication:5300734
DOI10.1080/00949655.2010.517533zbMATH Open1431.62026OpenAlexW2075042104MaRDI QIDQ5300734FDOQ5300734
Authors: Ehsan Zamanzade, Nasser Reza Arghami 
Publication date: 28 June 2013
Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00949655.2010.517533
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Statistical aspects of information-theoretic topics (62B10) Nonparametric hypothesis testing (62G10)
Cites Work
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Cited In (19)
- Goodness of fit test using Lin-Wong divergence based on Type-I censored data
- On entropy goodness-of-fit test based on integrated distribution function
- Goodness-of-fit tests based on Verma Kullback-Leibler information
- Tests of fit for the Laplace distribution based on correcting moments of entropy estimators
- New entropy estimator with an application to test of normality
- Goodness-of-fit tests based on correcting moments of entropy estimators
- A new estimator for Shannon entropy
- Characterization of exponential distribution using extropy based on lower \(k\)-records and its application in testing exponentiality
- Testing exponentiality based on the extropy of record values
- Non-parametric estimation of the extropy and the entropy measures based on progressive type-II censored data with testing uniformity
- A comprehensive empirical power comparison of univariate goodness-of-fit tests for the Laplace distribution
- Modified estimators of Renyi entropy with application in testing exponentiality based on transformed data
- Jackknife empirical likelihood test for testing one-sided Lévy distribution
- Extropy estimators with applications in testing uniformity
- On the choice of nonparametric entropy estimator in entropy-based goodness-of-fit test statistics
- Entropy-based goodness of fit test for a composite hypothesis
- Correcting moments for goodness of fit tests based on two entropy estimates
- Modified entropy estimators for testing normality
- A wide review on exponentiality tests and two competitive proposals with application on reliability
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