Effects of elastic anisotropy on the surface stability of thin film/substrate system
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Publication:540841
DOI10.1016/J.IJENGSCI.2008.07.008zbMATH Open1213.76028OpenAlexW2054988763MaRDI QIDQ540841FDOQ540841
Authors: Xi-Shu Wang, Ying Li, Qin-Shan Fan
Publication date: 4 June 2011
Published in: International Journal of Engineering Science (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ijengsci.2008.07.008
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Cites Work
- Some general properties of stress-driven surface evolution in a heteroepitaxial thin film structure
- Morphological stability of epitaxial thin elastic films by van der Waals force
- A boundary perturbation analysis for elastic inclusions and interfaces
- Evolution of waviness on the surface of a strained elastic solid due to stress-driven diffusion
- Perturbation analysis of an undulating free surface in a multi-layered structure
Cited In (4)
- A multilayer film coating with slightly curved boundary
- Anisotropic surface energy formulations and their effect on stability of a growing thin film
- Interplay of quantum size effect, anisotropy and surface stress shapes the instability of thin metal films
- Effect of elastic anisotropy on surface pattern evolution of epitaxial thin films
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