Linear Models for Optimal Test Design

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Publication:5693240


DOI10.1007/0-387-29054-0zbMath1084.62115MaRDI QIDQ5693240

Wim J. van der Linden

Publication date: 22 September 2005

Full work available at URL: https://doi.org/10.1007/0-387-29054-0

overconstrainting; pivot-item; quantitative constraints; random test length; reference test; relative target; single test; Swanson-Stocking heuristics; test characteristic function; transshipment points; unidimensional ability; weighted-deviation method; weighted-objective approach; integer programming; simulated annealing; Monte Carlo method; genetic algorithms; linear approximation; simplex algorithm; cost function; enumeration; active constraints; Kullback-Leibler information; dynamic model; minimax approach; simultaneous optimization; goodness-of-fit; variance function; BIB design; pruning; objective function; optimal design; feasibility; response function; infeasibility; response-time; sequential optimization; two-stage; item calibration; tree search; three-stage approach; test splitting; redundant constraints; convex space; blueprint; Sympson-Hetter method; Greedy heuristics; linear decomposition; branch-and-bound search; nonlinear objectives; information function; local search heuristics; design model; test reliability; logical constraints; inconsistent constraints; categorical constraints; parallel forms; predictive validity; power-set; classification of attributes; test assembly; item-response theory; pretest-posttest design; ability measurement; ability scale; absolute target; adaptive test assembly; aggregated bound; Alpha stratification; Bayesian item-selection criterion; big-shadow-test; binomial-error model; Birnbaum approach; classical test design; composite ability; conditional item-exposure control; cutoff score; different item pool; edited-set; equating transformation; equipercentile; fixed test length; Gulliksen's matched random subsets method; heuristic correction; ineligibility constraints; intentional factor; item author; item mapping; item matching; item overlap; item set; item swapping; item writing; item-criterion correlation; item-difficulty; item-discrimination; item-exposure control; item-parameter estimation; Kelderman method; linear on-the-fly testing; Lord-Wingersky algorithm; Luecht heuristics; marginal item-exposure control; modern test design; multidimensional ability; multiobjective test assembly; multiple abilities; multiple-shadow-test; network-flow approximation; nuisance ability; observed-score; operational item pool


62J05: Linear regression; mixed models

62J99: Linear inference, regression

90C90: Applications of mathematical programming

62-02: Research exposition (monographs, survey articles) pertaining to statistics

62P15: Applications of statistics to psychology


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