A unified approach for predicting long- and short-term capability indices with dependence on manufacturing target bias
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Publication:613738
DOI10.1155/2008/594753zbMath1202.62190OpenAlexW2047516874WikidataQ58646078 ScholiaQ58646078MaRDI QIDQ613738
Nikhil T. Satyala, R. J. Pieper
Publication date: 22 December 2010
Published in: International Journal of Quality, Statistics, and Reliability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1155/2008/594753
Inference from stochastic processes and prediction (62M20) Applications of statistics in engineering and industry; control charts (62P30)
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