Determination of the mean energy of backscattered electrons in dependence on the exit angle

DOI10.3103/S106287381007018XzbMATH Open1236.82089OpenAlexW2000300124MaRDI QIDQ664004FDOQ664004

Authors: A. V. Gostev, S. A. Ditsman, V. G. Dyukov, F. A. Luk'yanov, R. A. Sennov, Eduard I. Rau 

Publication date: 28 February 2012

Published in: Bulletin of the Russian Academy of Sciences: Physics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s106287381007018x

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zbMATH Keywords

electron backscatteringsemiconductor detector

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37) Experimental work for problems pertaining to statistical mechanics (82-05)

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• THE FORMULAS FOR THE SECONDARY ELECTRON YIELD AT HIGH INCIDENT ELECTRON ENERGY FROM GOLD AND ALUMINUM
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• Measurement of backscattering coefficient of positron using the characteristic X-rays
• Extraction of cross-sections of inelastic scattering from energy spectra of reflected atomic particles

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