Characterization of semiconductor detectors of (1-30)-keV monoenergetic and backscattered electrons

DOI10.3103/S1062873808110026zbMATH Open1177.82121OpenAlexW2137213337MaRDI QIDQ736274FDOQ736274

Authors: A. V. Gostev, S. A. Ditsman, V. V. Zabrodskii, N. V. Zabrodskaya, F. A. Luk'yanov, R. A. Sennov, V. L. Sukhanov, Eduard I. Rau 

Publication date: 27 October 2009

Published in: Bulletin of the Russian Academy of Sciences: Physics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s1062873808110026

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zbMATH Keywords

scatteringsemiconductorelectron beam

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37)

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