An X-ray fluorescence depth distribution function for electron beam microanalysis

DOI10.3103/S1062873810070245zbMATH Open1233.82038MaRDI QIDQ664016FDOQ664016

Authors: N. N. Mikheev, M. A. Stepovich, E. V. Shirokova 

Publication date: 28 February 2012

Published in: Bulletin of the Russian Academy of Sciences: Physics (Search for Journal in Brave)

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zbMATH Keywords

electron beam microanalysis

Mathematics Subject Classification ID

Electron optics (78A15) Transport processes in time-dependent statistical mechanics (82C70)

Cited In (3)

• x-ray attenuation factors in fluorescence intensity emission -- effects of finite sample size
• Grazing-incidence XRF analysis of layered samples: Detailed study of amplitude calculation
• Title not available (Why is that?)

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