Numerical simulations of stress generation and evolution in Volmer-Weber thin films

DOI10.1016/J.JMPS.2008.02.008MaRDI QIDQ731104zbMATH OpenOpenAlexFDO

Authors Juan S. Tello, A. F. Bower

Publication date 1 October 2009

Published in Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.jmps.2008.02.008

zbMATH Keywords

cohesive zonefinite element analysisthin film stressvolmer-Weber growth

Mathematics Subject Classification ID

Thin films (74K35) Finite element methods applied to problems in solid mechanics (74S05)

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Cites work

• Adaptive techniques in the finite element method
• Mechanics of compressive stress evolution during thin film growth
• Numerical simulations of fast crack growth in brittle solids

Cited in

(5)

• Atomistic simulation of stress evolution during island growth
• Mechanics of compressive stress evolution during thin film growth
• A multiscale coupled finite-element and phase-field framework to modeling stressed grain growth in polycrystalline thin films
• Micron-scale channel formation by the release and Bond-back of pre-stressed thin films: a finite element analysis
• Effects of interfacial properties on the ductility of polymer-supported metal films for flexible electronics

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