Development of a multiple intermittent fault testing strategy

DOI10.1016/0045-7906(83)90022-8zbMATH Open0531.94027OpenAlexW1993230025MaRDI QIDQ788700FDOQ788700

Authors: Richard Jay Spillman 

Publication date: 1983

Published in: Computers and Electrical Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0045-7906(83)90022-8

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zbMATH Keywords

testingMarkov processesconfidencecircuitsmaskingmultiple intermittent faults

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Circuits, networks (94C99) Continuous-time Markov processes on general state spaces (60J25)

Cited In (2)

• Optimal testing-policies for intermittent faults
• A continuous time model of multiple intermittent faults in digital systems

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