Repairing VLSI/WSI redundant memories with minimum cost

DOI10.1007/BF02943424MaRDI QIDQ805209zbMATH OpenFDO

Authors N. E. Zubov

Publication date 1990

Published in Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/BF02943424

zbMATH Keywords

memory chipsoptimal repair-solutionrepair cost

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Recommendations

• Efficient Repair Analysis Algorithm Exploration for Memory With Redundancy and In-Memory ECC
• Reconfiguration for Repair in a Class of Universal Logic Modules
• A low hardware overhead self-diagnosis technique using reed-solomon codes for self-repairing chips

Cites work

• Increased throughput for the testing and repair of RAMs with redundancy
• On a Novel Self-test Approach to Digital Testing

Cited in

(1)

• Generation of minimal vertex covers for row/column allocation in self-repairable arrays

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