Nonlinear dynamics, stability and control of the scan process in noncontacting atomic force microscopy

DOI10.1007/S11071-008-9335-5zbMATH Open1178.74122OpenAlexW2140652510MaRDI QIDQ840474FDOQ840474

Authors: S. Hornstein, O. Gottlieb 

Publication date: 11 September 2009

Published in: Nonlinear Dynamics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11071-008-9335-5

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zbMATH Keywords

nonlinear microbeamAtomic Force Microscopy (AFM)escape bifurcationMelnikov-Holmes stabilityMoon-Chirikov overlapscan dynamics

Mathematics Subject Classification ID

Micromechanics of solids (74M25) Stability of dynamical problems in solid mechanics (74H55) Control, switches and devices (``smart materials) in solid mechanics (74M05)

Cites Work

• Nonlinear oscillations, dynamical systems, and bifurcations of vector fields
• Nonlinear dynamics and chaos
• Title not available (Why is that?)
• Chaotic phenomena triggering the escape from a potential well
• A new approach to the modeling of distributed structures for control
• Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
• Dynamical analysis and control of microcantilevers
• Chaotic Dynamics of a Quasi-Periodically Forced Beam
• Nonlinear non-planar parametric responses of an inextensional beam

Cited In (3)

• An electrically actuated imperfect microbeam: dynamical integrity for interpreting and predicting the device response
• Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials
• Asymptotic analysis of a noncontact AFM microcantilever sensor with external feedback control

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