A characterization of the angle defect and the Euler characteristic in dimension 2

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Abstract: The angle defect, which is the standard way to measure curvature at the vertices of polyhedral surfaces, goes back at least as far as Descartes. Although the angle defect has been widely studied, there does not appear to be in the literature an axiomatic characterization of the angle defect. We give a characterization of the angle defect for simplicial surfaces, and we show that variants of the same characterization work for two known approaches to generalizing the angle defect to arbitrary 2-dimensional simplicial complexes. Simultaneously, we give a characterization of the Euler characteristic on 2-dimensional simplicial complexes in terms of being geometrically locally determined.


The ``Descartes-Gauss-Bonnet Theorem \(\sum_{v\in M} d(v,M) = 2\pi \chi(M)\) relates the curvature (angle defect or deficiency) \(d(v,M):=2\pi - \sum_{\alpha\ni v} \alpha\) at the vertices \(v\) of a triangulated polyhedral surface \(M\) to the Euler characteristic \(\chi(M)\) of \(M\). The author gives a characterization of the angle defect for simplicial surfaces and shows that variants of that work for two approaches to generalizing \(d(v,M)\) to arbitrary 2-dimensional simplicial complexes, one of which the author has given in [Beitr. Algebra Geom. 39, No. 2, 379--393 (1998; Zbl 0917.52010)]. Simultaneously, a characterization of \(\chi(M)\) is given for such complexes.











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