Effect of geometry upon the performance of a thin film ferroelectric capacitor

DOI10.1016/J.IJSOLSTR.2007.11.017zbMath1149.74022OpenAlexW1999166211MaRDI QIDQ957400

D. P. Chu, Ivindra Pane, Norman A. Fleck, John E. Huber

Publication date: 27 November 2008

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2007.11.017

zbMATH Keywords

finite element methodetchingedge inclination angle

Mathematics Subject Classification ID

Finite element methods applied to problems in solid mechanics (74S05) Electromagnetic effects in solid mechanics (74F15) Thin films (74K35)

Related Items (1)

The influence of mechanical constraint upon the switching of a ferroelectric memory capacitor

Uses Software

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Cites Work

• Finite element analysis of crystalline solids
• Multi-grain analysis versus self-consistent estimates of ferroelectric polycrystals
• On singularities in composite piezoelectric wedges and junctions
• Ferroelectric switching: a micromechanics model versus measured behaviour
• A constitutive model for ferroelectric polycrystals
• Multi-axial electrical switching of a ferroelectric: Theory versus experiment
• On the local and average energy release in polarization switching phenomena

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