Cohesive modeling of crack nucleation under diffusion-induced stresses in a thin strip: implications on the critical size for flaw tolerant battery electrodes

From MaRDI portal
Publication:991717

DOI10.1016/j.ijsolstr.2010.02.001zbMath1193.74142OpenAlexW2057896991WikidataQ60158318 ScholiaQ60158318MaRDI QIDQ991717

Tanmay K. Bhandakkar, Hua-Jian Gao

Publication date: 7 September 2010

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2010.02.001




Related Items



Cites Work


This page was built for publication: Cohesive modeling of crack nucleation under diffusion-induced stresses in a thin strip: implications on the critical size for flaw tolerant battery electrodes