Rectifying Inspection for Defects

DOI10.1109/TR.1986.4335454MaRDI QIDQ3740539zbMATH OpenFDO

Authors W. C. Guenther

Publication date 1986

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TR.1986.4335454

zbMATH Keywords

average cost per lotaverage outgoing quality limitBayes sampling plansgamma priorrectifying inspection plans

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)

Recommendations

• Optimum rectifying inspection plans
• Generalized cost and gain functions in lot-by-lot sampling inspection
• \(\alpha\)-optimal sampling plans for lot-by-lot defects inspection
• An Economic Choice of Sampling Inspection Plans Under Varying Process Quality
• Dodge-Romig AOQL single sampling plans for inspection by variables

Cited in

(2)

• Optimum rectifying inspection plans
• Sequential Defect Removal Sampling

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