Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design

DOI10.1109/TC.2012.131MaRDI QIDQ5369898zbMATH OpenFDO

Authors Yuan-Hao Chang, Po-Chun Huang, Pei-Han Hsu, Lue-Jane Lee, Tei-Wei Kuo, David H. C. Du

Publication date 19 October 2017

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.2012.131

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Recommendations

• A Management Strategy for the Reliability and Performance Improvement of MLC-Based Flash-Memory Storage Systems
• Design Methodology for Highly Reliable, High Performance ReRAM and 3-Bit/Cell MLC NAND Flash Solid-State Storage
• Flash-Aware RAID Techniques for Dependable and High-Performance Flash Memory SSD
• Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems
• Improving Performance and Capacity of Flash Storage Devices by Exploiting Heterogeneity of MLC Flash Memory

Cited in

(2)

• Fejér-Hermite-Hadamard inequalities for \(n\)-times differentiable preinvex functions
• Design Methodology for Highly Reliable, High Performance ReRAM and 3-Bit/Cell MLC NAND Flash Solid-State Storage

This page was built for publication: Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5369898)