SCIRTSS: A Search System for Sequential Circuit Test Sequences

DOI10.1109/TC.1977.1674866MaRDI QIDQ4132140zbMATH OpenOpenAlexFDO

Authors Fredrick J. Hill, Ben Huey

Publication date 1977

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1977.1674866

Mathematics Subject Classification ID

Cited in

(1)

• Evaluation of a fan out stem based fault simulation in sequential circuits

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