Semiconductor final test scheduling with Sarsa( , k) algorithm
From MaRDI portal
Semiconductor final test scheduling with Sarsa\((\lambda , k)\) algorithm
Recommendations
- Flow shop scheduling with reinforcement learning
- Semiconductor final-test scheduling under setup operator constraints
- scientific article; zbMATH DE number 1960880
- Minimizing mean weighted tardiness in unrelated parallel machine scheduling with reinforcement learning
- Towards a knowledge-based scheduling system for semiconductor testing
Cites work
- scientific article; zbMATH DE number 3436645 (Why is no real title available?)
- A policy gradient method for semi-Markov decision processes with application to call admission control
- Autonomous vehicle navigation using evolutionary reinforcement learning
- Capacity planning with reconfigurable kits in semiconductor test manufacturing
- Capacity-constrained scheduling for a logic IC final test facility
- Convergence results for single-step on-policy reinforcement-learning algorithms
- Experimental analysis on Sarsa(λ) and Q(λ) with different eligibility traces strategies
- Multi-objective optimization of water-using systems
- Scheduling of wafer test processes in semiconductor manufacturing
Cited in
(3)- Semiconductor final-test scheduling under setup operator constraints
- Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information
- A SIMULATED ANNEALING ALGORITHM FOR SYSTEM-ON-CHIP TEST SCHEDULING WITH, POWER AND PRECEDENCE CONSTRAINTS
This page was built for publication: Semiconductor final test scheduling with Sarsa\((\lambda , k)\) algorithm
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q421685)
