Pages that link to "Item:Q3341722"
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The following pages link to A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring (Q3341722):
Displaying 12 items.
- Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor (Q963891) (← links)
- Bayesian design for accelerated life testing (Q1205462) (← links)
- Accelerated life test planning with independent lognormal competing risks (Q2655071) (← links)
- Equivalent accelerated life testing plans for log-location-scale distributions (Q3580164) (← links)
- Optimal design of accelerated life testing plans for periodical replacement with penalty (Q3621909) (← links)
- Planning accelerated life tests with type II censored data (Q3734937) (← links)
- A dynamic bayesian approach to inference from accelerated life tests (Q4240798) (← links)
- On minimax designs when there are two candidate models (Q4808197) (← links)
- Optimal design of accelerated degradation tests based on Wiener process models (Q5124762) (← links)
- Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals (Q5719271) (← links)
- Sequential Bayesian Design for Accelerated Life Tests (Q6622452) (← links)
- Model Misspecification of Generalized Gamma Distribution for Accelerated Lifetime-Censored Data (Q6636553) (← links)
