The following pages link to Tong-Yi Zhang (Q359505):
Displaying 12 items.
- The charge-free zone model for electrically conductive cracks in dielectric and piezoelectric ceramics (Q359506) (← links)
- Effects of thickness on the polarization states in epitaxial ferroelectric thin films (Q359515) (← links)
- Dielectric breakdown model for a conductive crack and electrode in piezoelectric materials (Q538774) (← links)
- Phase field simulations of low-dimensional ferroelectrics (Q610464) (← links)
- Critical thickness for misfit twinning in an epilayer (Q837302) (← links)
- Linear electro-elastic analysis of a cavity or a crack in a piezoelectric material (Q1287212) (← links)
- Fracture mechanics for a mode III crack in a piezoelectric material (Q1388607) (← links)
- Interaction of an edge dislocation with a thin-film-covered crack (Q1579957) (← links)
- The strip dielectric breakdown model (Q1959855) (← links)
- Controlled asymmetric bidirectional hybrid of remote state preparation and quantum teleportation (Q2300817) (← links)
- Fracture mechanics for a mode III crack in a magnetoelectroelastic solid (Q2571881) (← links)
- Controlled asymmetric bidirectional quantum teleportation of two- and three-qubit states (Q2684217) (← links)
