The following pages link to Kyungmee O. Kim (Q395909):
Displayed 10 items.
- Effects of manufacturing defects on the device failure rate (Q395910) (← links)
- Burn-in considering yield loss and reliability gain for integrated circuits (Q421527) (← links)
- Optimal number of components in a load-sharing system for maximizing reliability (Q684058) (← links)
- Multiscale representation for irregularly spaced data (Q1674059) (← links)
- Evaluating the failure risk with and without failure data (Q2126021) (← links)
- Bayesian reliability when system and subsystem failure data are obtained in the same time period (Q2511819) (← links)
- Optimal burn-in for maximizing reliability of repairable non-series systems (Q2519085) (← links)
- A unified model incorporating yield, burn-in, and reliability (Q3156747) (← links)
- A general model of heterogeneous system lifetimes and conditions for system burn-in (Q4456072) (← links)
- RELIABILITY COMPARISON OF TWO UNIT REDUNDANCY SYSTEMS UNDER THE LOAD REQUIREMENT (Q5051940) (← links)
