The following pages link to (Q5849272):
Displaying 9 items.
- On the relation between rough set reducts and typical testors (Q526674) (← links)
- The length of a single fault detection test for constant-nonpreserving element insertions (Q830998) (← links)
- Single fault detection tests for generalized iterative switching circuits (Q887392) (← links)
- A new algorithm for reduct computation based on gap elimination and attribute contribution (Q2195414) (← links)
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements (Q2356509) (← links)
- Diagnosis of constant faults in iteration-free circuits over monotone basis (Q2636825) (← links)
- Combinatorial results on the complexity of teaching and learning (Q5096898) (← links)
- An overview of the evolution of the concept of testor (Q5929036) (← links)
- Shannon function of the test length with respect to gate input identification (Q6195911) (← links)
