Pages that link to "Item:Q5928445"
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The following pages link to Optimal burn-in decision for products with an unimodal failure rate function (Q5928445):
Displaying 9 items.
- Effects of manufacturing defects on the device failure rate (Q395910) (← links)
- Burn-in considering yield loss and reliability gain for integrated circuits (Q421527) (← links)
- Burn-in and the performance quality measures in heterogeneous populations (Q531447) (← links)
- Determination of the optimal accelerated burn-in time under Arrhenius-log normal distribution assumption (Q639178) (← links)
- Using parametric classification trees for model selection with applications to financial risk management (Q1751885) (← links)
- Statistical inference about the shape parameter of the Burr type XII distribution under the failure-censored sampling plan (Q1774951) (← links)
- Burn-in for a time-transformed exponential model (Q1936295) (← links)
- Optimal burn-in for maximizing reliability of repairable non-series systems (Q2519085) (← links)
- The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation (Q4928867) (← links)
