The following pages link to Chiranjit Mukhopadhyay (Q736575):
Displaying 11 items.
- Bayesian accelerated life testing under competing log-location-scale family of causes of failure (Q736577) (← links)
- Bayesian analysis for masked system failure data using non-identical Weibull models (Q1300937) (← links)
- Bayesian analysis of incomplete time and cause of failure data (Q1361736) (← links)
- Maximum likelihood analysis of masked series system lifetime data (Q2581649) (← links)
- Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure (Q2876219) (← links)
- Bayesian Analysis of a Superimposed Renewal Process (Q3083779) (← links)
- Asymptotics of a bayesian approach to estimating change-point in a hazard rate (Q3125806) (← links)
- Bayesian Analysis of Masked Series System Lifetime Data (Q3435984) (← links)
- (Q4257309) (← links)
- (Q4887567) (← links)
- Bayesian<i>D</i>-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure (Q5138096) (← links)
