Testing Uniformity Via Log-Spline Modeling
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Cites work
- scientific article; zbMATH DE number 3138903 (Why is no real title available?)
- scientific article; zbMATH DE number 5604036 (Why is no real title available?)
- scientific article; zbMATH DE number 52869 (Why is no real title available?)
- A new class of random number generators
- A practical guide to splines
- Approximation of density functions by sequences of exponential families
- Asymptotic comparison of Cramér-von Mises and nonparametric function estimation techniques for testing goodness-of-fit
- Consistency and Monte Carlo simulation of a data driven version of smooth goodness-of-fit tests
- Data driven versions of pearson's chisquare test for uniformity
- Data-Driven Version of Neyman's Smooth Test of Fit
- Estimating the dimension of a model
- Large sample theory for U-statistics and tests of fit
- Large-sample inference for log-spline models
- On Sums of Random Vectors
- On the Choice of the Number of Class Intervals in the Application of the Chi Square Test
- Pearson's X 2 and the Loglikelihood Ratio Statistic G 2 : A Comparative Review
- THE CHOICE OF CELLS IN CHI–SQUARE TESTS
- Test of Significance Based on Wavelet Thresholding and Neyman's Truncation
- Testing goodness of fit via nonparametric function estimation techniques
Cited in
(5)- On Existence of Maximum Likelihood Estimators in Exponential Families
- Data-driven smooth tests for a location-scale family revisited
- Dyadic diagonalization of positive definite band matrices and efficient \(B\)-spline orthogonalization
- Maximum likelihood estimation for discrete exponential families and random graphs
- On large deviation theorem for data-driven Neyman's statistic
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