Tightened single-level continuous sampling plan

DOI10.1080/02664769822945MaRDI QIDQ4266317zbMATH OpenOpenAlexFDO

Authors S. Balamurali, K. Govindaraju

Publication date 30 September 1999

Published in Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/02664769822945

zbMATH Keywords

quality control

Mathematics Subject Classification ID

Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Applications of statistics in engineering and industry; control charts (62P30)

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Cites work

• A Sampling Inspection Plan for Continuous Production
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(12)

• Optimal scheme for process quality and cost control by integrating a continuous sampling plan and the process yield index
• Expected cost for continuous sampling plans
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• Modified tightened two-level continuous sampling plans
• Modified Tightened Three Level Continuous Sampling Plan
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• On the modes of the negative binomial distribution of order \(k\), type I
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• Minimum average fraction inspected for TCSP-1 plan
• A Sequential Markov Chain Monte Carlo Approach to Set-up Adjustment of a Process over a Set of Lots

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