Two direct sampling methods for an anisotropic scatterer with a conductive boundary
As noted by the authors, the main focus of this paper is the inverse shape problem for the same underlying model considered in the work of \textit{O. Bondarenko} and \textit{A. Kirsch} [Inverse Probl. 32, No. 10, Article ID 105011, 17 p. (2016; Zbl 1356.78081)]. The principal contribution lies in the analysis of two direct sampling methods (one for recovering the scatterer from far-field data and the other from near-field measurements) as highlighted in the title, for reconstructing the penetrable scatterer.\N\NFor the problem of recovering the scatterer from far-field data, one of the key ingredients is a symmetric factorization of the far-field operator. Consequently, the proposed approach may be viewed as a variant of the \textit{factorization method}. For a general exposition of the factorization method, we refer, for instance, to the monograph by \textit{A. Kirsch} and \textit{N. Grinberg} [The factorization method for inverse problems. Oxford Lecture Series in Mathematics and Its Applications 36 (2008; Zbl 1222.35001)].\N\NFor the problem of recovering the scatterer from near-field data (formulated in terms of Cauchy data on the boundary of a domain \(\Omega\) that properly contains the scatterer \(D\)) the central idea is to analyze the reciprocity gap functional associated with the given material. More precisely, the authors introduce a reciprocity gap imaging functional \(I_{\mathrm{RG}}(z)\) defined in terms of the scattered field and the standard outgoing fundamental solution \(\Phi\), and prove that\N\[\NI_{\mathrm{RG}}(z) = O\left(\mathrm{dist}\,(z,D)^{\frac{p(1-d)}{2}} \right)\N\]\Nwhere \(p\) is a regularization parameter specified in the definition of \(I_{\mathrm{RG}}(z)\), and \(\mathrm{dist}\,(z,D)\) denotes the distance from the sampling point \(z\) to the scatterer \(D\).\N\NFinally, we remark that although the authors restrict their analysis to the cases \(d=2\) and \(d=3\), the inverse scattering problem can in fact be formulated in arbitrary spatial dimension \(d \ge 2\). In this general setting, the standard outgoing fundamental solution \(\Phi\) of the Helmholtz equation is given by\N\[\N\Phi(x,y) := \frac{\mathbf{i}k^{\frac{d-2}{2}}}{4(2\pi)^{\frac{d-2}{2}}}|x-y|^{-\frac{d-2}{2}}H_{\frac{d-2}{2}}^{(1)}(k|x-y|)\N\]\Nwhere \(H_{\nu}^{(1)}\) denotes the Hankel function of the first kind of order \(\nu\). Moreover, its far-field pattern takes the particularly simple form of a plane wave, namely\N\[\N\Phi^{\infty}(\hat{x},y) = e^{-\mathbf{i}k\hat{x}\cdot y} \quad \text{for all \(\hat{x}\in S^{d-1}\) and \(y\in\mathbb{R}^{d}\)}.\N\]\NBy taking a suitable linear combination of the real and imaginary parts of the fundamental solution, one can establish a mean value theorem for the Helmholtz operator. See, for example, [the reviewer et al., Potential Anal. 60, No. 1, 387--424 (2024; Zbl 1535.35044)].
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