Two single-shot methods for locating multiple electromagnetic scatterers
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Abstract: We develop two inverse scattering schemes for locating multiple electromagnetic (EM) scatterers by the electric far-field measurement corresponding to a single incident/detecting plane wave. The first scheme is for locating scatterers of small size compared to the wavelength of the detecting plane wave. The multiple scatterers could be extremely general with an unknown number of components, and each scatterer component could be either an impenetrable perfectly conducting obstacle or a penetrable inhomogeneous medium with an unknown content. The second scheme is for locating multiple perfectly conducting obstacles of regular size compared to the detecting EM wavelength. The number of the obstacle components is not required to be known in advance, but the shape of each component must be from a certain known admissible class. The admissible class may consist of multiple different reference obstacles. The second scheme could also be extended to include the medium components if a certain generic condition is satisfied. Both schemes are based on some novel indicator functions whose indicating behaviors could be used to locate the scatterers. No inversion will be involved in calculating the indicator functions, and the proposed methods are every efficient and robust to noise. Rigorous mathematical justifications are provided and extensive numerical experiments are conducted to illustrate the effectiveness of the imaging schemes.
The authors consider a time-harmonic inverse electromagnetic scattering problem, where some information of a scatterer is reconstructed from the knowledge of the far field pattern generated by the interaction of a known incident plane wave and the scatterer itself. In particular, they propose two schemes for locating the connected components of this scatterer from the knowledge of a single far field pattern. The first scheme deals with scatterers having small connected components of general electromagnetic nature, i.e., penetrable obstacles and perfectly conducting obstables. The second scheme takes into account scatterers having perfectly conducting connected components and with size approximately equal to the wavelength of the probing electromagnetic field. Some numerical experiments are reported.
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