Using negative correlation to evolve fault-tolerant circuits

DOI10.1007/3-540-36553-2_4MaRDI QIDQ4418701zbMATH OpenFDO

Authors Thorsten Schnier, Xin Yao

Publication date 11 August 2003

Published in Lecture Notes in Computer Science (Search for Journal in Brave)

Full work available at URL http://link.springer.de/link/service/series/0558/bibs/2606/26060035.htm

Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Computing methodologies and applications (68U99) Fault detection; testing in circuits and networks (94C12)

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• Recent advances in evolutionary computation
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• Untidy evolution: Evolving messy gates for fault tolerance

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