Variational treatment of electrostatic interaction force in atomic force microscopy

DOI10.1007/S00033-007-7041-7MaRDI QIDQ957851zbMATH OpenOpenAlexFDO

Authors B. E. Eshmatov

Publication date 1 December 2008

Published in ZAMP. Zeitschrift für angewandte Mathematik und Physik (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s00033-007-7041-7

zbMATH Keywords

atomic force microscopegeneralized Fourier seriesSobolev spaces

Mathematics Subject Classification ID

Fourier integral operators applied to PDEs (35S30) Fourier coefficients, Fourier series of functions with special properties, special Fourier series (42A16) Variational methods applied to problems in optics and electromagnetic theory (78M30)

Review text

The authors discuss a computational method which allows the authors to determine the electrostatic interaction force between an atomic force microscope tip and the sample surface. After formulating the corresponding boundary value problem in a Sobolev space setting, the authors find the weak solution in the form of the integral potential. In the last part of the paper, this solution is approximated numerically using generalized Fourier series to make it applicable for practical computations.

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Cited in

(8)

• An improved proximity force approximation for electrostatics
• A two-scale model for an array of AFM's cantilever in the static case
• The contribution of the electrostatic proximity force to atomic force microscopy with insulators
• Modeling of electromechanical contact on a microscopic lengthscale
• Integral equation modeling of electrostatic interactions in atomic force microscopy
• Numerical computation of magnetic fields applied to magnetic force microscopy
• Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
• A study of mathematical model of AFM with Casimir force by means of averaging method

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