Variational treatment of electrostatic interaction force in atomic force microscopy

DOI10.1007/S00033-007-7041-7MaRDI QIDQ957851zbMATH OpenOpenAlexFDO

Authors B. E. Eshmatov

Publication date 1 December 2008

Published in ZAMP. Zeitschrift für angewandte Mathematik und Physik (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s00033-007-7041-7

zbMATH Keywords

Sobolev spacesatomic force microscopegeneralized Fourier series

Mathematics Subject Classification ID

Fourier integral operators applied to PDEs (35S30) Fourier coefficients, Fourier series of functions with special properties, special Fourier series (42A16) Variational methods applied to problems in optics and electromagnetic theory (78M30)

Recommendations

• Integral equation modeling of electrostatic interactions in atomic force microscopy
• The contribution of the electrostatic proximity force to atomic force microscopy with insulators
• Numerical modelling of electrostatic force microscopes considering charge and dielectric constant
• Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
• A variational approach to electrostatics of polarizable heterogeneous substances
• Approximating the effect of van der Waals force on the instability of electrostatic nano-cantilevers
• Modal interactions in contact-mode atomic force microscopes
• An improved proximity force approximation for electrostatics
• Electrostatic force computation with boundary element methods
• scientific article; zbMATH DE number 2232722

Cited in

(8)

• An improved proximity force approximation for electrostatics
• Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method
• A study of mathematical model of AFM with Casimir force by means of averaging method
• Numerical computation of magnetic fields applied to magnetic force microscopy
• Integral equation modeling of electrostatic interactions in atomic force microscopy
• Modeling of electromechanical contact on a microscopic lengthscale
• A two-scale model for an array of AFM's cantilever in the static case
• The contribution of the electrostatic proximity force to atomic force microscopy with insulators

This page was built for publication: Variational treatment of electrostatic interaction force in atomic force microscopy

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q957851)