Modal interactions in contact-mode atomic force microscopes

DOI10.1007/S11071-008-9388-5zbMATH Open1178.74131OpenAlexW1991229959MaRDI QIDQ840486FDOQ840486

Authors: Haider N. Arafat, Eihab M. Abdel-Rahman, A. H. Nayfeh 

Publication date: 11 September 2009

Published in: Nonlinear Dynamics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11071-008-9388-5

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zbMATH Keywords

nonlinear oscillationsmethod of multiple scalesmodal interactionsatomic force microscopescontact-mode AFM

Mathematics Subject Classification ID

Vibrations in dynamical problems in solid mechanics (74H45) Micromechanics of solids (74M25)

Cites Work

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• Resolving controversies in the application of the method of multiple scales and the generalized method of averaging
• Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
• Cohesion

Cited In (17)

• Effect of contact stiffness modulation in contact-mode AFM under subharmonic excitation
• Intuitive haptics interface with accurate force estimation and reflection at nanoscale
• Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model
• The effect of vibrations of the base of a tunnel microscope on the deviation of the program motion of a probe
• Variational treatment of electrostatic interaction force in atomic force microscopy
• Sensitivity vector fields for atomic force microscopes
• Integral equation modeling of electrostatic interactions in atomic force microscopy
• Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials
• Harnessing the transient signals in atomic force microscopy
• Resonance-size parameter relationship and dynamics of an AFM subjected to multimode excitation and based on the modified couple stress theory
• Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance
• Development of a mathematical model and analytical solution of a coupled two-beam array with nonlinear tip forces for application to AFM
• Inner-paddled microcantilever for multi-modal and nonlinear atomic force microscopy
• Output feedback control of piezoelectrically actuated non-classical micro-beams using T-S fuzzy model
• Title not available (Why is that?)
• Measurement error of a coupled AFM probe-elastic membrane system
• Real-time sliding mode observer scheme for shear force estimation in a transverse dynamic force microscope

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