Modal interactions in contact-mode atomic force microscopes

DOI10.1007/S11071-008-9388-5MaRDI QIDQ840486zbMATH OpenOpenAlexFDO

Authors Haider N. Arafat, Eihab M. Abdel-Rahman, A. H. Nayfeh

Publication date 11 September 2009

Published in Nonlinear Dynamics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s11071-008-9388-5

zbMATH Keywords

nonlinear oscillationsmethod of multiple scalesmodal interactionsatomic force microscopescontact-mode AFM

Mathematics Subject Classification ID

Vibrations in dynamical problems in solid mechanics (74H45) Micromechanics of solids (74M25)

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Cites work

• scientific article; zbMATH DE number 3703128 (Why is no real title available?)
• scientific article; zbMATH DE number 903908 (Why is no real title available?)
• scientific article; zbMATH DE number 3417938 (Why is no real title available?)
• scientific article; zbMATH DE number 3070283 (Why is no real title available?)
• Cohesion
• Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
• Resolving controversies in the application of the method of multiple scales and the generalized method of averaging

Cited in

(17)

• scientific article; zbMATH DE number 5499502 (Why is no real title available?)
• Real-time sliding mode observer scheme for shear force estimation in a transverse dynamic force microscope
• Effect of contact stiffness modulation in contact-mode AFM under subharmonic excitation
• Intuitive haptics interface with accurate force estimation and reflection at nanoscale
• Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model
• The effect of vibrations of the base of a tunnel microscope on the deviation of the program motion of a probe
• Variational treatment of electrostatic interaction force in atomic force microscopy
• Sensitivity vector fields for atomic force microscopes
• Integral equation modeling of electrostatic interactions in atomic force microscopy
• Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials
• Harnessing the transient signals in atomic force microscopy
• Resonance-size parameter relationship and dynamics of an AFM subjected to multimode excitation and based on the modified couple stress theory
• Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance
• Development of a mathematical model and analytical solution of a coupled two-beam array with nonlinear tip forces for application to AFM
• Output feedback control of piezoelectrically actuated non-classical micro-beams using T-S fuzzy model
• Inner-paddled microcantilever for multi-modal and nonlinear atomic force microscopy
• Measurement error of a coupled AFM probe-elastic membrane system

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