scientific article; zbMATH DE number 5499502

MaRDI QIDQ5506508zbMATH OpenFDO

Authors Michele Basso, Donatello Materassi

Publication date 28 January 2009

zbMATH Keywords

atomic force microscopyfrequency analysisharmonic balanceLuré modelsnanotechnologiesnonlinear control

Mathematics Subject Classification ID

Dynamical systems in other branches of physics (quantum mechanics, general relativity, laser physics) (37N20) Electron optics (78A15) Feedback control (93B52) Application models in control theory (93C95) Signal theory (characterization, reconstruction, filtering, etc.) (94A12)

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Cited in

(6)

• Effect of contact stiffness modulation in contact-mode AFM under subharmonic excitation
• Damped harmonic oscillator model for analyzing the dynamic characteristics of STM system
• Harnessing the transient signals in atomic force microscopy
• Phase-locked loop design applied to frequency-modulated atomic force microscope
• Modal interactions in contact-mode atomic force microscopes
• Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance

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