Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance

DOI10.1007/S11071-007-9329-8zbMATH Open1180.78016OpenAlexW1974144423MaRDI QIDQ840501FDOQ840501

Authors: Michele Basso, Donatello Materassi, Murti Salapaka 

Publication date: 11 September 2009

Published in: Nonlinear Dynamics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11071-007-9329-8

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zbMATH Keywords

hysteresisidentificationLur'e systemnanotechnologyatomic force microscopyharmonic balance

Mathematics Subject Classification ID

Electromagnetic effects in solid mechanics (74F15) Motion of charged particles (78A35)

Cites Work

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• A frequency method for predicting limit cycle bifurcations
• On Optimal Stabilization of Periodic Orbits via Time Delayed Feedback Control
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Cited In (9)

• Damped harmonic oscillator model for analyzing the dynamic characteristics of STM system
• New control methodology of microcantilevers in atomic force microscopy
• Bounding the parameters of block-structured nonlinear feedback systems
• Sensitivity vector fields for atomic force microscopes
• Iterative harmonic balance for period-one rotating solution of parametric pendulum
• A comprehensive model for transient behavior of tapping mode atomic force microscope
• Multivariable classical Prandtl-Ishlinskii hysteresis modeling and compensation and sensorless control of a nonlinear 2-dof piezoactuator
• Model Development for Atomic Force Microscope Stage Mechanisms
• Title not available (Why is that?)

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