A comprehensive model for transient behavior of tapping mode atomic force microscope
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Publication:2296232
DOI10.1007/S11071-019-05079-2zbMATH Open1430.70087OpenAlexW2953552846WikidataQ127521200 ScholiaQ127521200MaRDI QIDQ2296232FDOQ2296232
Authors: Aliasghar Keyvani, Mehmet Selman Tamer, Jan-Willem van Wingerden, Johannes F. L. Goosen, F. Van Keulen 
Publication date: 17 February 2020
Published in: Nonlinear Dynamics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s11071-019-05079-2
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Cites Work
Cited In (7)
- Nonlinear dynamics as an essential tool for non-destructive characterization of soft nanostructures using tapping-mode atomic force microscopy
- Feedback-induced instability in tapping mode atomic force microscopy: theory and experiment
- Title not available (Why is that?)
- Sensitivity vector fields for atomic force microscopes
- Harnessing the transient signals in atomic force microscopy
- Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance
- A two-scale model for an array of AFM's cantilever in the static case
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