A comprehensive model for transient behavior of tapping mode atomic force microscope

DOI10.1007/S11071-019-05079-2MaRDI QIDQ2296232zbMATH OpenOpenAlexWikidataFDO

Authors Aliasghar Keyvani, Mehmet Selman Tamer, Jan-Willem van Wingerden, Johannes F. L. Goosen, F. Van Keulen

Publication date 17 February 2020

Published in Nonlinear Dynamics (Search for Journal in Brave)

Copyright license Creative Commons Attribution 4.0 International

Full work available at URL https://doi.org/10.1007/s11071-019-05079-2

zbMATH Keywords

transient analysischaostapping modespeed limitmodulated model

Mathematics Subject Classification ID

Transition to stochasticity (chaotic behavior) for nonlinear problems in mechanics (70K55)

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Cites work

• Advances in Fractional Calculus
• Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials

Cited in

(9)

• Sensitivity vector fields for atomic force microscopes
• Harnessing the transient signals in atomic force microscopy
• Model-based topography estimation in trolling mode atomic force microscopy
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• scientific article; zbMATH DE number 1997557 (Why is no real title available?)
• Modelling and nanoscale force spectroscopy of frequency modulation atomic force microscopy
• Feedback-induced instability in tapping mode atomic force microscopy: theory and experiment
• Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance
• Nonlinear dynamics as an essential tool for non-destructive characterization of soft nanostructures using tapping-mode atomic force microscopy

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