Wafer defect detection using directional morphological gradient techniques

DOI10.1155/S1110865702204035MaRDI QIDQ1773574zbMATH OpenFDO

Authors Gongyuan Qu, Sally L. Wood, Cho Teh

Publication date 3 May 2005

Published in EURASIP Journal on Applied Signal Processing (Search for Journal in Brave)

Mathematics Subject Classification ID

Computing methodologies for image processing (68U10) Fault detection; testing in circuits and networks (94C12)

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• Defect extraction of ICT images based on adaptive morphological filtering
• Ball grid array (BGA) substrate conduct paths inspection using two-dimensional wavelet transform

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