A level-set method for simulating island coarsening (Q1577025): Difference between revisions

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Property / author: David L. Chopp / rank
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Property / full work available at URL: https://doi.org/10.1006/jcph.2000.6527 / rank
 
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Latest revision as of 13:31, 30 May 2024

scientific article
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A level-set method for simulating island coarsening
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    A level-set method for simulating island coarsening (English)
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    27 August 2000
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    From the author's conclusion: In this paper, we have presented an accurate numerical method, which successfully predicts the motion of single atomic layer islands. The method compares very favorably with solutions of model problems and agrees qualitatively with physical experiments. The method has been demonstrated to correctly predict the time of dissolution of islands in model problems while also maintaining very good conservation of mass. This is a tribute to the use of the finite element method to compute the adatom density on the terraces. We have also predicted the correct qualitative behavior of a given experiment. By adjusting parameters to match the physical experiment more accurately, and armed with the results from model problems, we will be able to confidently predict the critical physical constants necessary for any material simulations. This method also introduces the coupling of level sets with traditional finite element methods. This coupling promises to deliver greater accuracy and reliability into the solution of elliptic equations used in the computation of interface speed functions while still preserving the essential connection of level set methods to the methods from hyperbolic conservation laws.
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    predictions
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    thin-film growth
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    motion of single atomic layer islands
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    finite element method
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    coupling of level sets
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