Semiconductor final test scheduling with Sarsa\((\lambda , k)\) algorithm (Q421685): Difference between revisions

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+https://doi.org/10.1016/j.ejor.2011.05.052
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+Q4403756
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+Scheduling of wafer test processes in semiconductor manufacturing
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+Experimental analysis on Sarsa(λ) and Q(λ) with different eligibility traces strategies
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+Capacity-constrained scheduling for a logic IC final test facility
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+Multi-objective optimization of water-using systems
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+Convergence results for single-step on-policy reinforcement-learning algorithms
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+A policy gradient method for semi-Markov decision processes with application to call admission control
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+Autonomous vehicle navigation using evolutionary reinforcement learning
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+Capacity planning with reconfigurable kits in semiconductor test manufacturing
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