Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits (Q1873059): Difference between revisions
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Revision as of 15:33, 5 June 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits |
scientific article |
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Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits (English)
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19 May 2003
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The authors investigate combinatorial optimization problems reducing subset of tests of integrated circuits, which are redundant in a statistical sense. These problems are solved, using a simulated annealing local search technique. An example is given.
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numerical example
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redundancy elimination
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integrated circuits
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test cost reduction
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simulated annealing
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combinatorial optimization
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