A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts (Q1027930): Difference between revisions
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Revision as of 17:02, 1 July 2024
scientific article
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English | A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts |
scientific article |
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A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts (English)
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30 June 2009
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drop impacts
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shocks
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polysilicon MEMS sensors
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multi-scale FE analysis
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micro-mechanics
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