Radiation-induced Soft Errors: A Chip-level Modeling Perspective (Q3069057)

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Radiation-induced Soft Errors: A Chip-level Modeling Perspective
scientific article

    Statements

    title
    Radiation-induced Soft Errors: A Chip-level Modeling Perspective (English)
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    author
    N. Seifert
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    publication date
    24 January 2011
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    zbMATH Keywords
    soft-error rate
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    microprocessors
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    CMOS technologies
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    Identifiers

    DOI
    10.1561/1000000018
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    zbMATH DE Number
    5840665
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