Projection finite element methods for semiconductor device equations
Publication:1802465
DOI10.1016/0898-1221(93)90173-SzbMath0772.65081OpenAlexW2017954266MaRDI QIDQ1802465
Publication date: 21 July 1993
Published in: Computers \& Mathematics with Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/0898-1221(93)90173-s
error estimatesnonconforming finite elementsprojection finite element methodsstationary drift-diffusion semiconductors
PDEs in connection with optics and electromagnetic theory (35Q60) Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs (65N30) Technical applications of optics and electromagnetic theory (78A55) Applications to the sciences (65Z05)
Related Items (9)
Cites Work
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- Numerical simulation of semiconductor devices
- Hybrid variable finite elements for semiconductor devices
- An Inexpensive Method for the Evaluation of the Solution of the Lowest Order Raviart–Thomas Mixed Method
- An Optimal Order Process for Solving Finite Element Equations
- A Multigrid Algorithm for the Lowest-Order Raviart–Thomas Mixed Triangular Finite Element Method
- Analysis of mixed methods using conforming and nonconforming finite element methods
- Two-Dimensional Exponential Fitting and Applications to Drift-Diffusion Models
- On the Implementation of Mixed Methods as Nonconforming Methods for Second- Order Elliptic Problems
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