Diffraction and Palm measure of point processes

DOI10.1016/S1631-073X(02)00029-8zbMath1052.60037arXivmath/0208064MaRDI QIDQ1871538

Jean-Baptiste Gouéré

Publication date: 2003

Published in: Comptes Rendus. Mathématique. Académie des Sciences, Paris (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/math/0208064

zbMATH Keywords

crystals; Palm measure; cut-and-project method; diffraction measure; autocorrelation measure; stationary ergodic point process

Mathematics Subject Classification ID

60D05: Geometric probability and stochastic geometry

60G10: Stationary stochastic processes

82D25: Statistical mechanics of crystals

60G55: Point processes (e.g., Poisson, Cox, Hawkes processes)

Related Items

Stationary processes and pure point diffraction, Pure point/continuous decomposition of translation-bounded measures and diffraction, Fourier transformable measures with weak Meyer set support and their lift to the cut-and-project scheme, The computation of overlap coincidence in Taylor-Socolar substitution tiling, Spectral notions of aperiodic order, Algorithm for determining pure pointedness of self-affine tilings, Pure point spectrum for measure dynamical systems on locally compact Abelian groups, Pure point diffraction and cut and project schemes for measures: the smooth case, Substitution Delone sets with pure point spectrum are inter-model sets, Pure point diffractive substitution Delone sets have the Meyer property, Quasicrystals and almost periodicity, On the (dis)continuity of the Fourier transform of measures

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