Some classes of easily testable circuits in the Zhegalkin basis

DOI10.1515/dma-2023-0001OpenAlexW4321638967MaRDI QIDQ2688833

Yulia V. Borodina

Publication date: 6 March 2023

Published in: Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/dma-2023-0001

zbMATH Keywords

constant faultsfault detection testZhegalkin basiscircuit of gates

Mathematics Subject Classification ID

Circuits, networks (94Cxx) Boolean functions (94D10) Computer science (68-XX)

Cites Work

• Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS
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