DOI10.1109/TC.1979.1675429zbMath0414.94055OpenAlexW2024467749MaRDI QIDQ3050334
Se June Hong, Daniel L. Ostapko
Publication date: 1979 Published in: IEEE Transactions on Computers (Search for Journal in Brave) Full work available at URL: https://doi.org/10.1109/tc.1979.1675429
zbMATH Keywords
test generationfault analysisprogrammable logic arrays
Mathematics Subject Classification ID
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