Finite Element Approximation of a Phase Field Model for Void Electromigration

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Publication:4653884

DOI10.1137/S0036142902413421zbMath1076.78012OpenAlexW2030126035WikidataQ117202807 ScholiaQ117202807MaRDI QIDQ4653884

Vanessa Styles, John W. Barrett, Robert Nürnberg

Publication date: 1 March 2005

Published in: SIAM Journal on Numerical Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1137/s0036142902413421




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