Phase field computations for surface diffusion and void electromigration in R^3
DOI10.1007/S00791-008-0114-0zbMATH Open1259.78038OpenAlexW2009906820MaRDI QIDQ600929FDOQ600929
Authors: Ľubomír Baňas, Robert Nürnberg
Publication date: 3 November 2010
Published in: Computing and Visualization in Science (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00791-008-0114-0
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Cites Work
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- Finite Element Approximation of a Phase Field Model for Void Electromigration
- On the Cahn–Hilliard Equation with Degenerate Mobility
- Monotone multigrid methods for elliptic variational inequalities. I
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- A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid
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- On the parametric finite element approximation of evolving hypersurfaces in \(\mathbb R^3\)
- On Schwarz-type smoothers for saddle point problems
- Finite Element Approximation of the Cahn--Hilliard Equation with Degenerate Mobility
- Finite element approximation of a fourth order nonlinear degenerate parabolic equation
- Nonsmooth Newton methods for set-valued saddle point problems
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- The Cahn–Hilliard equation with a concentration dependent mobility: motion by minus the Laplacian of the mean curvature
- Motion by intrinsic Laplacian of curvature
- Numerical solutions for the surface diffusion flow in three space dimensions
- A numerical scheme for moving boundary problems that are gradient flows for the area functional
Cited In (9)
- A flux-corrected phase-field method for surface diffusion
- Finite element approximation of a phase field model for surface diffusion of voids in a stressed solid
- Finite element approximation of a three dimensional phase field model for void electromigration
- Upper bounds for coarsening for the deep quench obstacle problem
- On the stable discretization of strongly anisotropic phase field models with applications to crystal growth
- Three-dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion
- A phase field model for the electromigration of intergranular voids
- A multigrid method for the Cahn-Hilliard equation with obstacle potential
- Finite Element Approximation of a Phase Field Model for Void Electromigration
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